Thin-layer drying and wetting of wheat
R. Sinicio, W. E. Muir, D. S. Jayas and S. Cenkowski
Postharvest Biology and Technology, Volume 5, Number 3, February 1995 , pp. 261-275
1995
บทคัดย่อ
The research objectives were to determine accurate thin-layer drying and wetting equations for `Katepwa' wheat. Equilibrium moisture content (EMC) equations for adsorption and desorption were also developed based on the experimental drying and wetting data. The modified Chung-Pfost equation predicted reasonably well the EMC for both adsorption and desorption of wheat. The range of test conditions were: temperature 7.6-35.1°C; relative humidity 28-92%; air velocity 0.04-0.2 m s-1; and initial moisture content 9.2-16.7% (wet mass basis). Thin-layer drying of wheat was affected by air temperature, relative humidity, and initial moisture content while thin-layer wetting also slightly depended on air velocity. The semi-empirical equation of Page was more accurate than the theoretical diffusion equation with the diffusion coefficient dependent on temperature only.