Evaluation of postharvest losses of sweet onion (Allium cepa L.) cultivar Granex 33 harvested in the south of Uruguay for export to the USA (1993-1994)
Zaccari, F., Franco, J. and Bianchi, A.
Harvest and postharvest technologies for fresh fruits and vegetables. Year: 1995 Pages: 414-420.
1995
บทคัดย่อ
ABSTRACT :
A study of the causes of postharvest losses in onion cv. Granex 33 crops of 6 producers was carried out between Dec. 1993 and Feb. 1994. Bulbs were selected at random for evaluation at 2 postharvest stages: after curing (5-20 days after harvest) and before packing (30-55 days after harvest). Bulb quality was evaluated according to USDA and import and export standards. The percentage of bulbs reaching export standards after curing and before packing was 27.2 and 11.2%, respectively. The main causes of losses were small bulb diameter (<7.5 cm), bacterial rots, wet neck and wet skin.