Comparison of soft x-rays and NIR spectroscopy to detect insect infestations in grain
Chithra Karunakaran, Jitendra Paliwal, Digvir S. Jayas and Noel D. G. White
2005 ASAE Annual International Meeting, Tampa Convention Center, Tampa, Florida, 17-20 July 2005, Paper Number 053139, 11 p.
2005